Waygate CRxFlex II based Computed Radiography System

Thanks to its high read-out efficiency, this field-tested scanner delivers shorter exposure times, superior image quality, enhanced signal-to-noise ratio (SNR), and basic spatial resolution (SRb). Its upgraded core technology provides a range of scan resolutions from 25 microns to 200 microns, making it suitable for all NDT application segments.

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Description

The CRxFlex provides image quality with excellent IQI sensitivity due to its specially designed optics, its 25 to 200 micron pixel sampling resolution, and its 30 micron laser spot. This outstanding image quality is supported by a BAM certificate stating IP Class 1/40, with a CEN speed of 2500 according to EN14784-1:2005 and ISO 16731-1:2011. It also achieves performance level II at an ISO speed of 3200, according to ASTM E2446-15. Compared to other CR vendors, exposure time reduction between factor 4 and 20 can be achieved, while still complying to the most stringent standards.

For more information, see manufacturer’s brochure: CRxFlex II Brochure

 

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